Stock code
300554

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Chinese


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Instrument

EQUIPMENT

Picture Album

    Instrument
    SEM (Scanning Electron Microscope)

     SEM (Scanning Electron Microscope)


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    Application: For Super-large magnification analyzing

    Pre：Malvern Laser Particle Analyzer
    Next：SHIMADZU Miniature Tension Testing apparatus
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    Address:Zecheng Road 77, Chunhua street, Jiangning District, Nanjing, China

    Tel:+86-25-84154668 84154777-8000

    Fax:+86-25-84154558

    E-Mail: sanchao@diasc.com.cn

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